← 返回 JSSC 论文列表
📄 下载 JSSC 原文 PDF
JSSC 2006第3期Memory90nmSRAM

90-nm Process-Variation Adaptive Embedded SRAM Modules With Power-Line-Floating

90纳米工艺自适应嵌入式SRAM模块采用电源线浮动技术降低功耗
0.8V操作电压,512kb SRAM模块48.4μA动态泄漏电流,7.8μA待机泄漏电流
低功耗嵌入式SRAM工艺变化自适应电源线浮动泄漏电流
创新点1:电源线浮动写入技术(电路创新),通过浮动电源线降低写入操作的最小工作电压100 mV,显著提升低电压写入性能。
创新点2:工艺变化自适应写入复制电路(系统创新),采用自适应电路动态调整写入操作,减少工艺变化对SRAM性能的影响,提升稳定性。
创新点3:泄漏电流减少技术(电路创新),优化字线驱动电路,减少64%的主动泄漏电流,显著降低功耗。
创新点4:扩展写入容限技术(电路创新),通过优化SRAM设计扩展写入容限,提升写入操作的可靠性和稳定性。
Abstract
The power consumption of a low-power system-on-a- chip (SoC) has a large impact on the battery life of mobile appli- ances. General SoCs have large on-chip SRAMs, which consume a large proportion of the whole LSI power. To achieve a low-power SoC, we have developed embedded SRAM modules, which use some low-power SRAM techniques. One technique involves expanding the write margin; another is a power-line-floating write technique, which enables low-voltage write operation. The power-line-floating wri