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JSSC 2006第7期Data Converters0.13μmPipeline ADC

A 10-bit 400-MSs 160-mW 013- 22m CMOS Dual-Channel Pipeline ADC Without Channel

一款无需通道校准的10位400MS/s双通道流水线ADC,采用自适应闭环采样技术
10-bit 400-MS/s 160-mW 0.13-μm CMOS
双通道ADC流水线结构自适应采样增益失配时钟偏移
创新点1:自适应闭环采样技术消除通道偏移(方法创新)。通过多级放大器构建的闭环反馈系统动态调整采样参数,有效消除通道间偏移误差,实测偏移失配小于0.1%,无需额外校准电路。
创新点2:多级高增益放大器设计(电路创新)。采用级联放大器结构实现>100dB的DC增益,在1.2V低电源电压下保持大信号摆幅,将通道间增益失配控制在0.2%以内。
创新点3:单时钟边沿采样方案(系统创新)。通过同步化双通道的采样时钟触发边沿,将时钟偏差降低至皮秒级,在400MS/s高速采样下实现29MHz输入信号的54.8dB SNDR。
创新点4:混合架构优化(系统创新)。结合流水线与时间交织技术,在0.13μm CMOS工艺下实现4.2mm²面积效率,功耗仅160mW,较同类设计降低20%以上。
Abstract
This paper describes a 10-bit 400-MS/s dual-channel analog-to-digital converter (ADC) insensitive to offset, gain, and sampling-time mismatches between channels. An adaptive closed-loop sampling technique based on a multi-stage amplifier eliminates the channel offset effectively. Multi-stage amplifiers with high DC gain reduce the gain mismatch between channels and guarantee a large signal swing at low supply voltages. A single clock-edge sampling scheme for clock-skew reduction minimizes the samp