JSSC 2006第12期Data Converters90nm

A 1-ps Resolution Jitter-Measurement Macro Using Interpolated Jitter Oversamplin

开发了一种具有1-ps分辨率的实时抖动测量宏，采用插值抖动过采样等技术。

1-ps分辨率，90nm工艺

抖动测量高分辨率实时过采样校准

▸创新点1：插值抖动过采样技术通过创新的信号处理算法，将传统采样率提升至1-ps分辨率，显著提高了抖动测量的精度，属于方法创新。

▸创新点2：分层游标延迟线采用多级延迟结构，优化了时间间隔测量的线性度和分辨率，属于电路创新，实现了高精度的时序测量。

▸创新点3：前馈校准技术通过实时校正系统误差，提高了测量的一致性和准确性，属于系统创新，确保了长期稳定性。

▸创新点4：过采样率和测量范围控制技术通过动态调整采样参数，扩展了测量范围至4倍，同时保持高分辨率，属于系统级优化。

Abstract

This paper reports the development of an in-ﬁeld real- time successive jitter-measurement macro whose features include 1-ps resolution jitter measurement. The newly developed jitter- measurement macro has four key features: 1) interpolated jitter oversampling; 2) a hierarchical Vernier delay line; and 3) feed- forward calibration, each of which helps attain high jitter-mea- surement resolution; as well as 4) an oversampling rate and mea- surement range-control technique. A test chip of the macro