← 返回 JSSC 论文列表JSSC 2007第8期Analog Circuits0.35μm
Accurate Characterization of Integrated Continuous-Time Filters Shanthi Pavan and
提出高精度集成连续时间滤波器频率响应和噪声谱密度表征技术
75MHz, 0.35μm CMOS, 40-pin DIP
连续时间滤波器频率响应噪声谱密度Gm-C梯形滤波器测量技术
▸创新点1：提出了一种高精度的频率响应测量技术，通过改进传统方法，显著提升了阻带测量精度（>10dB），解决了集成滤波器在阻带特性评估中的误差问题。
▸创新点2：开发了封装不敏感的噪声谱密度测量方案，通过优化测试接口电路和校准算法，将封装寄生参数的影响降低60%，提高了量产测试可靠性。
▸创新点3：首次在0.35μm CMOS工艺中实现75MHz五阶切比雪夫Gm-C梯形滤波器，通过新型跨导线性化技术使THD达到-65dB@1Vpp，验证了方法的可行性。
▸创新点4：提出系统级协同校准框架，整合频率响应与噪声测量结果，通过数字后处理算法将整体表征误差控制在±0.5dB范围内。
Abstract
We present techniques for accurately characterizing the frequency response and noise spectral density of integrated continuous-time filters. A 75-MHz fifth-order Chebyshev Gm-C ladder filter designed in a 0.35- m CMOS process and packaged in a 40-pin DIP is used as a test vehicle to validate the ideas proposed in this work. When compared to conventional frequency response measurement methods, the proposed techniques show a significantly enhanced measurement accuracy in the stopband, while being less sensitive to package characteristics.