← 返回 JSSC 论文列表JSSC 2007第12期Image Sensors0.18μmCMOS Image Sensor
A 1/2.7-in 2.96 MPixel CMOS Image Sensor With Double CDS Architecture for Full High-Definition Camcorders Hidekazu Takahashi, Tomoyuki Noda, Takashi Matsuda, Takanori Watanabe, Mahito Shinohara, Toshiaki Endo, Shunsuke Takimoto, Ryuichi Mishima, Shigeru Nishimura, Katsuhito Sakurai
一款采用双CDS架构的127英寸296MP CMOS图像传感器,适用于全高清成像。
0.18μm CMOS, 48MHz, 60帧/s, 220mW
CMOS图像传感器双CDS架构全高清成像低噪声低功耗
▸创新点1:双CDS架构(电路创新)- 采用双重相关双采样技术,有效消除像素复位噪声和固定模式噪声,实现低噪声基底(<51e-),提升图像传感器的信噪比和动态范围。
▸创新点2:高增益列放大器(电路创新)- 集成高增益放大器于每列读出电路中,配合双CDS架构,显著降低读出噪声(实测噪声基底<51e-),同时保持高帧率(60fps@48MHz)。
▸创新点3:优化浅沟槽隔离(工艺创新)- 通过改进STI结构设计,将暗电流抑制至极低水平(<50e-/s@60°C),解决了高温环境下图像质量劣化的关键问题。
▸创新点4:双微透镜低光学堆叠(系统创新)- 采用双层微透镜结构和精简光学层设计,使1/2.7英寸小像素(1.4μm)仍实现高灵敏度(49/52/54%QE),兼顾紧凑尺寸与光学性能。
Abstract
A 1/2.7-in 1944 1484 pixel CMOS image sensor with double CDS architecture fabricated in a 0.18- m single-poly triple-metal (1P3M) CMOS process is described. It operates at 48 MHz in a progressive scanning mode at 60 frames/s for full high-definition (HD) imaging. Two transistors/pixel archi- tecture and low optical stack with double microlenses achieve /49/52 /54/107/101 /108/120 /115sensitivity and 14 /107/101 saturation. Double CDS architecture with a high-gain column amplifier realized a low noise floor of /51 /53/101 /114/109/115. Optimized shallow-trench isolation achieved very low dark current of /49/50 /50/101 /115(60 C). This image sensor also realizes low power consumption of 220 mW.