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JSSC 2008第4期Memory65nmSRAM

An 8T-SRAM for V ariability Tolerance and Low-V oltage Operation in High-Perform

提出一种8T-SRAM单元,提升高速缓存中的变异容忍度和低电压操作性能。
32 kb子阵列,1.2V下5.3 GHz,0.41V下295 MHz
多端口存储器SRAM稳定性静态噪声容限写入容限
8T单元设计提升稳定性和写入容限
无需辅助或动态电源供应
在65nm PD-SOI CMOS工艺下实现高性能
Abstract
Montoye , Member , IEEE, Y utaka Nakamura, Kevin A. Batson, Richard J. Eickemeyer , Senior Member , IEEE, Robert H. Dennard , Fellow, IEEE, Wilfried Haensch, and Damir Jamsek Abstract—An eight-transistor (8T) cell is proposed to improve variability tolerance and low-voltage operation in high-speed SRAM caches. While the cell itself can be designed for exceptional stability and write margins, array-level implications must also be considered to achieve a viable memory solution. These constraints