Abstract
ember , IEEE, Randy Persaud , Member , IEEE, and Chris H. Kim , Member , IEEE
Abstract—Precise measurement of digital circuit degradation
is a key aspect of aging tolerant digital circuit design. In this
study, we present a fully digital on-chip reliability monitor for
high-resolution frequency degradation measurements of digital
circuits. The proposed technique measures the beat frequency
of two ring oscillators, one stressed and the other unstressed, to
achieve 50
higher delay sensing resoluti