Abstract
, Senior Member , IEEE, Thierry Taris, and
Jean-Baptiste Bégueret, Member , IEEE
Abstract—A self-testable and highly reliable low noise amplifier
designed in 0.13
m CMOS technology is presented in this paper.
This reliable LNA could be used to design the front-end of critical
nodes in wireless local area networks to ensure data transmission.
The LNA test, based on a built-in self test methodology, monitors
its behavior. The test circuit is composed of one
/100/100sensor and one
biasing voltage s