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JSSC 2009第1期Memory45nmSRAM

A 38 GHz 153 Mb SRAM Design With Dynamic Stability Enhancement and Leakage Reduc

45纳米技术下开发的高性能低功耗153Mb SRAM,采用动态稳定性增强和漏电减少技术。
45nm高k金属栅技术, 1.1V, 3.8GHz
SRAM低功耗高k金属栅正向体偏置动态稳定性
动态SRAM PMOS正向体偏置(FBB)
主动控制的SRAM VCC睡眠模式
优化的0.346μm²/506T-SRAM位单元
Abstract
Fatih Hamzaoglu, Member , IEEE, Kevin Zhang , Senior Member , IEEE, Yih Wang , Member , IEEE, Hong Jo Ahn, Uddalak Bhattacharya , Member , IEEE, Zhanping Chen , Member , IEEE, Y ong-Gee Ng, Andrei Pavlov, Member , IEEE, Ken Smits , Member , IEEE, and Mark Bohr , Fellow, IEEE Abstract—A high-performance low-power 153 Mb SRAM is developed in 45 nm high-k Metal Gate technology. Dynamic SRAM PMOS forward-body-bias (FBB) and Active-Controlled SRAM VCC in Sleep are integrated in the design to lower A