← 返回 JSSC 论文列表JSSC 2009第1期Other65nm/130nm
Introduction to the Special Issue on the 2008 IEEE International Solid-State Cir
2008年ISSCC会议精选论文，涵盖高性能数字电路和系统芯片设计。
16核心, 32线程, 2.05亿晶体管
高性能数字电路SPARC处理器Itanium处理器动态变异性软错误
▸第三代SPARC处理器支持推测和事务内存语义
▸Tukwila四核Itanium处理器创纪录集成20.5亿晶体管
▸RazorII处理器主动检测并校正工艺、电压和温度变化
Abstract
te Circuits Conference
(ISSCC) is the foremost global forum for presenting ad-
vances in solid-state circuits and systems-on-a-chip. Every year
since its very first issue, the IEEE J OURNAL OF SOLID-STATE
CIRCUITS has highlighted some well-received papers from the
most recent ISSCC in special issues. This special issue is for
the ISSCC conference held in San Francisco, CA, February 3–7,
2008. Session chairs and co-chairs initially recommended pa-
pers for publication, with final decision for inclu