Ultra-Sensitive Capacitive Detection Based on SGMOSFET Compatible With Front-End

Abstract

Capacitive measurement of very small displacement of nano-electro-mechanical systems (NEMS) presents some issues that are discussed in this article. It is shown that performance is fairly improved when integrating on a same die the NEMS and CMOS electronics. As an initial step toward full integration, an in-plane suspended gate MOSFET (SGMOSFET) compatible with a front-end CMOS has been developed. The device model, its fab- rication, and its experimental measurement are presented. Perfor- mance