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JSSC 2009第4期Power Management45nmSRAM

A 06 V Dual-Rail Compiler SRAM Design on 45 nm CMOS Technology With Adaptive SRA

提出一种0.6V 45nm双轨SRAM设计,采用自适应电压调节器降低最小工作电压。
0.6V 45nm CMOS
双轨SRAM静态噪声容限跟踪电压调节器
自适应生成Cell-Vdd(CVDD)机制
位线预充电至VDD而非CVDD
降低VDD和CVDD电源网格的拥塞
Abstract
ry Chan, Shao Yu Chou, Hsien-Yu Pan, Jui-Jen Wu, Robin Lee, H. J. Liao, and Hiroyuki Yamauchi, Member , IEEE Abstract—A 0.6 V 45 nm dual-rail SRAM design utilizing an adaptive voltage regulator targeted for the SRAM compiler application is proposed for the first time. The proposed work describes an adaptive mechanism to generate Cell-Vdd (CVDD), which tracks a certain voltage offset with respect to the Logic-Vdd (VDD). This dual-rail solution provides a mean to lower the VDD down to 0.6 V. In thi