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All-Digital Ring-Oscillator-Based Macro for Sensing Dynamic Supply Noise Waveform Y asuhiro Ogasahara
提出全数字门控振荡器电路，用于动态电源噪声波形测量。
5.3–8.3 Gsample/s, 10.08×6.72 μm²/50
门控振荡器动态电源噪声全数字电路电源完整性标准单元
▸创新点1：全数字门控振荡器电路，采用标准单元构建，无需模拟电路，简化了设计流程并提高了可移植性，适用于SoC集成。
▸创新点2：改进的电源门控结构，通过优化电源管理策略，显著提升了采样率，达到6.6–8.3 Gsample/s，增强了动态电源噪声的捕捉能力。
▸创新点3：基于标准单元设计，易于嵌入SoC，降低了设计复杂性和成本，同时保持了高性能，面积仅为10.08×6.72 μm²。
▸创新点4：通过硅验证和实际测量，验证了门控振荡器的特性，并成功应用于电源完整性验证，展示了其在实际应用中的可靠性。
Abstract
This paper proposes an all-digital measurement cir- cuit called a “gated oscillator” to capture the waveforms of dy- namic power supply noise. An improved gated oscillator with a power-gating structure is also proposed. The gated oscillator is constructed using standard cells, and thus is easily embedded in SoCs. Its performance was evaluated using test chips fabricated in a 90 nm process. The gated oscillator achieved 5.3–5.9 Gsample/s with an area of 10.08 6.72 m/50, and the improved power gating structure achieved 6.6–8.3 Gsample/s in a 90 nm process. The char- acteristics of the gated oscillator and related design issues are also discussed. These characteristics were verified on silicon. We eval- uated the effect of the decoupling capacitance based on measure- ment results obtained using the gated oscillator, and demonstrated that it could be used to verify power integrity.