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JSSC 2010第1期MemoryDRAM

8 Gb 3-D DDR3 DRAM Using Through-Silicon-Via Technology Uksong Kang Hoe-Ju Chung

8Gb 3D DDR3 DRAM采用TSV技术,提升性能和能效。
1600 Mb/s I/O速度,100 mV电源噪声
TSV技术3D堆叠DDR3 DRAM主从架构电源噪声降低
主从架构降低待机和运行功耗
TSV检测与修复方案提高组装良率至98%
额外电源边沿焊盘减少电源噪声
Abstract
im, Soon-Hong Ahn, Soo-Ho Cha, Jaesung Ahn, DukMin Kwon, Jae-Wook Lee, Han-Sung Joo, Woo-Seop Kim , Member , IEEE, Dong Hyeon Jang, Nam Seog Kim, Jung-Hwan Choi, Tae-Gyeong Chung, Jei-Hwan Y oo, Joo Sun Choi, Changhyun Kim, Senior Member , IEEE, and Y oung-Hyun Jun Abstract—An 8 Gb 4-stack 3-D DDR3 DRAM with through-Si-via is presented which overcomes the limits of conventional modules. A master-slave architecture is proposed which decreases the standby and active power by 50 and 25%, respective