← 返回 JSSC 论文列表
📄 下载 JSSC 原文 PDF
JSSC 2010第1期Other45nm

Introduction to the Special Issue on the 2009 IEEE International Solid-State Cir

2009年ISSCC会议精选论文特刊,聚焦高性能数字电路与处理器技术
2.3B晶体管, 8核64位, 24MB L3缓存, 45nm工艺
ISSCC多核处理器功耗优化45nm工艺缓存技术
创新点1:多核处理器架构设计 - 采用八核双线程64位架构,集成24MB共享L3缓存,显著提升并行计算能力和数据处理效率。
创新点2:功耗优化技术 - 引入多时钟域和电压域设计,结合长沟道器件和缓存睡眠模式,有效降低功耗和泄漏电流。
创新点3:制造良率提升方法 - 通过核心和缓存恢复技术,提高制造良率,并支持同一硅片生产多种产品版本,增强生产灵活性。
创新点4:三维封装技术 - 采用高带宽10微米间距微焊点互连,将内存芯片与逻辑芯片堆叠,实现系统级封装,解决大容量片上内存面积占用问题。
Abstract
te Circuits Conference (ISSCC) is the foremost global forum for presenting ad- vances in solid-state circuits and systems-on-a-chip. Every year since its very first issue, the IEEE J OURNAL OF SOLID-STATE CIRCUITS has highlighted some well-received papers from the most recent ISSCC in special issues. This special issue is for the ISSCC conference held in San Francisco, CA, February 8–12, 2009. Session chairs and co-chairs initially recommended papers for publication, with final decision for inclus