Abstract
Systematic and random parametric mismatches are major performance limiters as well as notorious causes for redesigns of high precision mixed-signal circuits and systems. Therefore, it is extremely important to measure, analyze, inter- pret, model and document parametric mismatch mechanisms meticulously for mixed-signal technologies. This paper gives an overview of the main requirements and techniques for mismatch characterization of active and passive devices in deep submicron mixed-signal IC technologies.