Abstract
Abdelkarim Mercha, Herman Oprins,
Cristina Torregiani, Steven Thijs , Member , IEEE, Dimitri Linten , Member , IEEE, Michele Stucchi,
Guruprasad Katti, Dimitrios V elenis, Vladimir Cherman, Bart V andevelde, V eerle Simons,
Ingrid De Wolf, Senior Member , IEEE, Riet Labie, Dan Perry, Stephane Bronckers, Nikolaos Minas, Miro Cupac,
Wouter Ruythooren, Jan V an Olmen, Alain Phommahaxay, Muriel de Potter de ten Broeck, Ann Opdebeeck,
Michal Rakowski, Bart De Wachter, Morin Dehan, Marc Nelis, Rahul