← 返回 JSSC 论文列表JSSC 2011第9期Digital Circuits0.5μm BiCMOSNeural Network Accelerator
A Single-Temperature Trimming Technique for MOS-Input Operational Ampli fiers Ach
提出一种基于单温度测量的MOS输入运算放大器偏移和漂移校准技术
最大偏移漂移0.33°C (3σ), 工作温度范围0°C至100°C
运算放大器偏移校准温度漂移MOS差分对单温度测量
▸可重构输入级实现单温度下的偏移和漂移校准
▸通过偏置电流变化预测MOS差分对的漂移特性
▸理论分析与实验验证相结合的校准方法
Abstract
A MOS-input operational ampli fier has a recon fig-
urable input stage that enables trimming of both offset and offset
drift based only on single-tempera ture measurements. The input
stage consists of a MOS differential pair, whose offset drift is pre-
dicted from offset voltage measurements made at well-de fined bias
currents. A theoretical motivat ion for this approach is presented
and validated experimentally by characterizing the offset of pairs
of discrete MOS transistors as a function of bias