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A 10-Bit 80-MS/s Decision-Select Successive Approximation TDC in 65-nm CMOS
本文提出了一种采用决策选择结构的10位80-MS/s逐次逼近时间数字转换器(TDC),用于片上时间测量应用。
65nm CMOS, 9.6mW, 80-MS/s, 0.23-pJ/conversion-step FOM, 0.5-LSB单次精度
时间数字转换器逐次逼近决策选择结构指数延迟线片上测量
▸创新点1:决策选择结构实现快速位转换(方法创新)。该结构通过展开逐次逼近迭代循环,消除了耗时的时序估计和调整过程,显著提高了位转换速度,使采样率达到80-MS/s,同时保持高精度。
▸创新点2:采用指数延迟线减少延迟阶段数量(电路创新)。通过二进制搜索策略,指数延迟线优化了延迟阶段的分布,仅需0.048个延迟阶段每比特转换,降低了功耗和噪声,实现了9.6 mW的低功耗和0.23-pJ/conversion-step的优异能效比。
▸创新点3:逐次逼近方案实现高分辨率和低功耗(系统创新)。利用输入与参考时序的相对时间差,该方案在10比特分辨率下实现了高精度(0.5-LSB单次精度)和低功耗的平衡,适用于片上时序测量应用。
▸创新点4:测试芯片在65-nm CMOS工艺中的验证(工艺创新)。原型芯片展示了实际性能与理论设计的匹配,验证了该TDC在先进工艺下的可行性和可扩展性,为后续研究提供了可靠的实验基础。
Abstract
This paper presents a 10-bit 80-MS/s successive ap- proximation time-to-digital converter (TDC) with a decision-select structure for on-chip timing measu rement applications. Time-do- main successive approximation is realized utilizing a relative timing difference between input a nd reference timings. While the successive approximation scheme allows high bit resolutions and low power consumptions, the decision-select structure enables fast bit conversions that lead to high sampling rates. The decision-se- lect structure unrolls the success ive approximation iteration loop and removes time-consuming tim ing estimation and adjustment procedures to minimize bit conversion times. As the successive approximation scheme relies on a bi nary search, exponential delay lines are adopted to achieve good power and noise performances by reducing the total number of delay stages. The proposed TDC uses only 0.048 delay stages per bi t conversion. A test-chip proto- type fabricated in a 65-nm CMOS technology consumes 9.6 mW at 80-MS/s and demonstrates 0.23-pJ/conversion-step figure-of merit (FOM) and 0.5-LSB single-shot precision.