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JSSC 2012第6期Clocking & PLLs5nm/4nmDLLDRAM

A 1.0-ns/1.0-V Delay-Locked Loop With Racing Mode and Countered CAS Latency Controller for DRAM Interfaces

提出一种具有竞速模式和计数器CAS延迟控制的10ns10V延迟锁定环(DLL),实现低功耗、低抖动和快速锁定。
1.5ns tCK下512周期内将10%占空比误差校正至2%以内,1.2V下工作频率超过1.0GHz
延迟锁定环DDR3 SDRAM低功耗低抖动CAS延迟控制
采用竞速模式的双DLL架构
合并双粗延迟线(MDCDL)降低功耗
OR-AND功能占空比校正器(OR-AND DCC)
Abstract
The digital delay-locked loop (DLL) with racing mode and the countered column address strobe (CAS) latency controller are proposed in this paper. The dual-DLL architecture with racing operation is adopted to achieve low power consump- tion, low jitter, fast locking, wide range of locking, and stuck-free control. The merged dual coarse delay line (MDCDL) reduces the dynamic power consumption of a variable delay line by 30% by sharing a part of the delay line path in DLL. In addition, jitter is reduced by 45 ps in the 1066-DDR3 operating mode by MDCDL. The proposed DLL utilizes an OR-AND functioned duty cycle corrector ( OR-AND DCC), which consumes 15% of DLL’s power, 0.915 pJ/Hz at 1.5 ns and 1.575 V. The countered CAS latency controller (CCLC) saves IDD3N current because it does not need a DLL clock and does not need to be ac- tivated for IDD3N (active non-power down) state. The DLL clock is enabled and CCLC is activated only when the read command is issued. This operation condition saves the IDD3N current by 60% with the proposed DLL. The proposed DLL is employed in 128 M 8 DDR3 SDRAM and 64 M 16 DDR3 SDRAM. The former and the latter are fabricated by 5 nm and by 4 nm DRAM process technology, respectively. Experimental results show that 10% duty error of the external clock can be corrected to within 2% duty error in less than 512 cycles of locking time under 1.5 ns of tCK. The proposed DLL and CCLC can operate above 1.0-GHz operating frequency at 1.2 V in 5 nm DDR3 SDRAM and