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JSSC 2012第7期Power Management90nmVCOTDC

A 3.6 mW, 90 nm CMOS Gated-V ernier Time-to-Digital Converter With an Equivalent Resolution of 3.2 ps

一种采用门控环形振荡器的改进型Vernier时间数字转换器,进一步降低了量化噪声。
90nm CMOS, 1.2V, 25MHz, 3mA, 5.8ps分辨率, 3.2ps等效噪声分辨率
时间数字转换器门控环形振荡器Vernier结构量化噪声CMOS
采用门控环形振荡器(GRO)作为延迟线
进一步降低Vernier TDC的量化噪声
GRO操作实现一阶噪声整形
Abstract
Two gated ring oscillators (GROs) act as the delay lines in an improved V ernier time -to-digital converter (TDC), where the already small quantization noise of the standard Vernier TDC is further first-order shaped by the GRO operation. The TDC has been implemented in a 90 nm CMOS process and consumes 3 mA from 1.2 V when operating at 25 MHz. The native Vernier resolution of the TDC is 5.8 ps, while the total noise integrated over a bandwidth of 800 kHz yields an equivalent TDC resolution of 3.2 ps.