← 返回 JSSC 论文列表JSSC 2012第10期Power Management65nmSRAMDRAM
A 2T1C Embedded DRAM Macro With No Boosted Supplies Featuring a 7T SRAM Based Repair and a Cell Storage Monitor Ki Chul Chun, Wei Zhang , Student Member , IEEE, Pulkit Jain, and Chris H. Kim ,S e n i o rM e m b e r ,I E E E
提出一种无需升压电源的逻辑兼容2T1C eDRAM宏单元,采用7T SRAM修复方案
714MHz随机访问频率,161.8µW/Mb静态功耗(1.1V,85°C,500µs刷新周期)
eDRAM2T1C存储单元逻辑兼容自适应刷新SRAM修复
▸基于常规薄氧化层器件的2T1C增益单元结构
▸利用PMOS电容实现无升压电源的稳定读写操作
▸采用7T SRAM的修复方案与自适应刷新率控制
Abstract
A truly logic-compatible gain cell eDRAM macro with no boosted supplies is presented. A 2T1C gain cell implemented only with regular thin oxide devices consists of an asymmetric 2T cell and a coupling PMOS capacitor. The PMOS capaci tor ensures proper operation even without a b oosted supply by utilizing a ben- eficial coupling for read and a preferential boosting for write. A re- pair scheme based on a single-ended 7T SRAM has fe atures such as a local differential write and shared control with the main 2T1C array. A storage voltage monitor is proposed to track the reten- tion characteristics of a gain cell eDRAM under PVT variations and to adjust its refresh rate adaptively. A 128 kb eDRAM test chip implemented in a 65 nm Low-Power (LP) process operates at a random access frequency of 714 MHz wit h a static power dissi- pation of 161.8 µW per Mb for a 500 µs refresh rate at 1.1 V and 85°C.