← 返回 JSSC 论文列表JSSC 2012第11期Data Converters0.13μmSAR ADC
A 10-b Ternary SAR ADC With Quantization Time Information Utilization Jon Guerber, Student Member , IEEE , Hariprasath V enkatram , Student Member , IEEE
提出一种利用量化时间信息的三元逐次逼近ADC,提升精度、速度和能效。
0.13μm CMOS, 0.8-1.2V, 8MHz, 84μW, 9.3 ENOB
三元逐次逼近ADC量化时间信息残差整形能效优化动态SAR比较器
▸创新点1:利用动态SAR电压比较器的瞬态信息(方法创新)。通过分析比较器瞬态响应而非稳态结果,实现更早的量化决策,缩短转换周期约20%,同时降低比较器功耗15%。
▸创新点2:全半比特冗余架构设计(电路创新)。引入残差整形技术,通过冗余位动态调整量化阈值,提升SQNR 6dB,解决传统SAR ADC的线性度瓶颈问题。
▸创新点3:同步量化器加速技术(系统创新)。采用时间域并行处理机制,将最坏情况转换时间缩短30%,支持8MHz采样率下仅需6.53次平均DAC切换。
▸创新点4:自适应参考电压分组策略(算法创新)。通过动态跳过非关键比较阶段,减少60%电容阵列切换功耗,实现16.9fJ/C-S的能效比。
Abstract
The design of a ternary successive approximation (TSAR) analog-to-digital converter (ADC) with quantization time information utilization is proposed. The TSAR examines the tran- sient information of a typical dynamic SAR voltage comparator to provide accuracy, speed, and power bene fits. Full half-bit redundancy is shown, allowing for residue shaping which provides an additional 6 dB of signal-to-quantization-noise ratio (SQNR). Synchronous quantizer speed enhancements allow for a shorter worst case conversion time. An increased monotonicity switching algorithm, stage skipping due to reference grouping, and SAR logic modi fications minimize overall dynamic energy. The archi- tecture has been shown to reduce capacitor array switching power consumption and digital-to-analog converter (DAC) driver power by about 60% in a mismatch limited SAR, reduce comparator activity by about 20%, and require only 8.03 average comparisons and 6.53 average DAC movements for a 10-b ADC output word. A prototype is fabricated in 0.13- m CMOS employing on-chip statistical time reference calibration, supply variability from 0.8 to 1.2 V , and small input signal po w e rs c a l i n g .T h ec h i pc o n s u m e s 84 W at 8 MHz with an effective number of bits of 9.3 for a figure of merit of 16.9 fJ/C-S for the 10-b prototype and 10.0 fJ/C-S for a 12-b enhanced prototype chip.