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JSSC 2013第4期Clocking & PLLs32nmPLL

An Integral Path Self-Calibration Scheme for a Dual-Loop PLL Mark Ferriss Jean-O

32nm CMOS SOI工艺下20.1-26.7GHz双环路PLL采用积分路径自校准方案降低增益峰值波动
20.1GHz时相位噪声@10MHz偏移126.5dBc/Hz,24GHz时124.2dBc/Hz
自校准双环路PLL相位噪声CMOS SOI毫米波
积分路径自校准方案
双环路架构降低VCO小信号增益变化敏感度
增益峰值波动从2.4dB降至1dB
Abstract
An integral-path self-c alibration scheme is intro- duced as part of a 20.1 GHz to 26.7 GHz low-noise PLL in 32 nm CMOS SOI. A dual-loop architecture in combination with an integral path measurement and correction schem e desensitizes the loop transfer function to the V CO’s small signal gain varia- tions. The spread of gain peaking is reduced by self-calibration from 2.4 dB to 1 dB, when measured at 70 sites on a 300 mm wafer. The PLL has a measured phase noise @10 MHz offset of 126.5 dBc/Hz at