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JSSC 2013第11期Memory

Error-Prediction LDPC and Error-Recovery Schemes for Highly Reliable Solid-State Drives (SSDs) Shuhei Tanakamaru, Student Member , IEEE, Y uki Y anagihara, and Ken Takeuchi,M e m b e r ,I E E E

提出基于错误预测LDPC和错误恢复方案的高可靠性固态硬盘设计
数据保持时间提升10倍以上,比特错误率降低56%-76%
固态硬盘LDPC错误预测错误恢复NAND闪存
错误预测LDPC(EP-LDPC)方案减少读取周期
利用写/擦除周期、数据保持时间和单元耦合信息预测错误
错误恢复脉冲方案显著降低比特错误率
Abstract
Highly reliable solid-state drives (SSDs) with error-prediction low-densit y parity-check (EP-LDPC) and error-recovery schemes are prop osed. Since the reliability of the NAND flash memory of the SSD is ser iously degraded as the scaling, the conventional error -correction scheme is becoming useless. Thus, LDPC error-correcting code (ECC) is considered to be the next-generation ECC for SSD. However, many read cycles are required and the LDPC scheme consumes an unacceptably long read time. To solve this problem, the proposed EP-LDPC scheme realizes the 7 fewer sequential read cycles than the conventional LDPC scheme. Inste ad of reading repeatedly, the EP-LDPC scheme estimates errors from , write/erase cycles, data-retention time, and inter-cell coupling information. The bit error rate (BER) estimation is based on the prerecorded table which stores the relations among write/erase cycles, data-retention time, neighboring cell data, and BER. As a result, the acceptable data-retention time of the SSD increases by more than 10 . Additionally, the proposed erro r-recovery scheme is executed and reduces the bit error if the BER of the data exceeds the error-correction capability of EP-LDPC scheme. Program-dis- turb error-recovery pulse and data-retention error-recovery pulse reduce the BER of the NAND flash memory by 76% and 56%, respectively.