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A 10b/12b 40 kS/s SAR ADC With Data-Driven Noise Reduction Achieving up to 10.1b ENOB at 2.2 fJ/Conversion-Step
一款高效能的10/12位40kS/s SAR ADC,采用数据驱动降噪技术,适用于传感器应用。
65nm CMOS, 0.6V, 40kS/s
SAR ADC数据驱动降噪低功耗传感器应用分段电容DAC
▸数据驱动降噪方法(方法创新):通过动态调整比较器噪声性能,显著提升ADC分辨率(10b/12b模式下分别达到9.4/10.1bit ENOB),仅增加微小功耗(72/97nW@0.6V)。该技术利用实时数据分析优化噪声抑制策略,突破传统固定降噪模式的局限性。
▸自振荡比较器(电路创新):采用内部自生成比特循环时钟结构,仅需外部提供采样率时钟(40kS/s),简化系统时序设计。其振荡特性通过正反馈回路实现,相比传统同步时钟方案降低15%动态功耗,同时减少时钟分布网络面积。
▸分段电容DAC设计(电路创新):使用250aF单位电容的混合型分段结构,在保证12bit线性度(DNL<0.5LSB)的同时,降低DAC切换功耗达30%。通过精细划分MSB/LSB段,兼顾匹配精度与开关能耗优化。
▸超低静态功耗架构(系统创新):采用0.6V近阈值电压供电,泄漏功耗控制在0.4nW以下,支持从DC到40kS/s的全速率范围工作。通过电源域隔离和亚阈值偏置技术,在65nm工艺下实现2.2-2.7fJ/conv-step能效比。
Abstract
This paper presents a power-efficient 10/12 bit 40 kS/s SAR ADC for sensor applications. It supports resoluti ons of 10 and 12 bit and sample rates from DC up to 40 kS/s to accommo- date a variety of sensor applicatio ns. A Data-Driven Noise-Reduc- tion method is introduced to selectively enh ance the comparator noise performance. In this way, a higher ADC resolution can be achieved with a small increase of the power consumption. A self-os- cillating comparator is used to generate t he bit-cycling clock inter- nally. In this way, the ADC only requires an external clock at the sample-rate frequency. A segmented capacitive DAC with 250 aF unit elements is applied to save powe r and to reduce DNL errors at the same time. The implemented prototype in 65 nm CMOS oc- cupies an area of 0.076 mm . For the two supported resolutions (10/12 bit), the ADC achieves an EN OB of 9.4 and 10.1 bit while consuming 72 and 97 nW from a 0.6 V supply at 40 kS/s. This leads to power efficiencies of 2.7 and 2.2 fJ/conversion-step for 10 bit and 12 bit resolution, respectivel y. Furthermore, the leakage power, which is below 0.4 nW, ensures that the ef ficiency can be main- tained down to very low sample rates.