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JSSC 2014第2期Power Management0.18µmLDO

External Capacitor-Less Low Drop-Out Regulator With 25 dB Superior Power Supply Rejection in the 0.4–4 MHz Range

提出一种无外置电容的高电源抑制比LDO稳压器设计
0.18µm CMOS, 1.8V, 80µA静态电流, 56dB PSR@4MHz
LDO稳压器电源抑制比无外置电容噪声抵消SoC集成
创新点1:采用电源噪声抵消电路(方法创新),通过分析电源噪声至输出的传输路径并设计专用抵消电路,显著抑制高频噪声,实测PSR在4MHz时优于-56dB,较传统LDO提升25dB。
创新点2:使用PVT自适应的复制电路(电路创新),通过实时跟踪工艺-电压-温度变化下的主电源噪声特性,动态调整噪声抵消参数,确保全工况下PSR性能稳定,实现34dB@1MHz的PSR提升。
创新点3:无外置电容架构(系统创新),通过内部噪声抵消机制替代传统大体积外置电容,使芯片面积仅0.14mm²,同时支持50mA负载电流和200mV压差,满足SoC集成需求。
创新点4:双模式低静态电流设计(电路创新),工作模式与待机模式分别优化至80μA和55μA静态电流,兼顾动态性能与功耗效率。
Abstract
This paper presents design techniques for a high power supply rejection (PSR) low drop-out (LDO) regulator. A bulky external capacitor is avoided to make the LDO suitable for system-on-chip (SoC) applic ations while maintaining the capability to reduce high-freque ncy supply noise. The paths of the power supply noise to the LDO output are analyzed, and a power supply noise cancellation circuit is developed. The PSR performance is impr oved by using a replica circuit that tracks the main supply noise under proces s-voltage-temperature varia- tions and all operating conditions. The effectiveness of the PSR enhancement technique is experimentally veri fied with an LDO that was fabricated in a 0.18 µm CMOS technology with a power supply of 1.8 V. The active core chip area is 0.14 mm², and the entire proposed LDO consumes 80 µ A of quiescent current during operation mode and 55 µA of quiescent current in standby mode. It has a drop-out voltage of 200 mV when delivering 50 mA to the load. The measured PSR is better than –56 dB up to 4 MHz when delivering a current of 50 mA. Compared to a conventional uncompensated LDO, the proposed architecture presents a PSR improvement of 34 dB and 25 dB at 1 MHz and 4 MHz, respec- tively.