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Relation Between Delay Line Phase Noise and Ring Oscillator
通过开环相位噪声与整形函数相乘,推导出环形振荡器相位噪声的紧凑表达式。
65nm CMOS工艺验证
环形振荡器相位噪声闪烁噪声开环分析CMOS
▸提出通过开环相位噪声与整形函数相乘计算环形振荡器相位噪声的方法
▸证明环形振荡器中闪烁噪声上变频主要与总栅电容相关且不可避免
▸适用于闪烁噪声和白噪声引起的相位噪声分析
Abstract
The phase noise of a ring oscillator can be obtained by multiplying its open-loop phase noise by a simple shaping func- tion. The shaping function is computed using first principles and is applicable to both flicker-noise-induced and white-noise-induced phase noise, leading to compact equations for ring oscillators. It is also shown that flicker noise upconversion in ring oscillators is primarily a function of the total gate capacitance and inevitable regardless of the risetime and falltime symmetry. Two oscillator prototypes fabricated in 65-nm CMOS technology verify the va- lidity of the results.