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JSSC 2014第4期Clocking & PLLs90nm CMOS + 蘑菇型相变存储技术SRAM

1 Mb 0.41 µm² 2T-2R Cell Nonvolatile TCAM With Two-Bit Encoding and Clocked Self-Referenced Sensing

首款1 Mb非易失性TCAM,采用2T-2R单元,面积比SRAM TCAM小10倍以上。
1 Mb容量, 0.75V最低工作电压, 1.9ns匹配延迟
非易失性TCAM2T-2R单元相变存储器两比特编码自参考传感
创新点1:2T-2R单元结构(方法创新) - 采用双晶体管双电阻结构替代传统SRAM单元,实现041 µm²的超小单元面积,比同工艺节点的SRAM-based TCAM缩小10倍以上,显著提升存储密度。
创新点2:两比特编码技术(算法创新) - 通过两位编码压缩TCAM条目,有效提升存储效率并优化算法映射,同时增强低ON/OFF比(~10²)阻变存储器的信号容限,支持750 mV低电压搜索操作。
创新点3:时钟自参考传感方案CSRSS(电路创新) - 针对阻变存储器ON/OFF比低导致的传感裕度退化问题,提出动态时钟参考机制,在1.9 ns匹配延迟下实现可靠信号检测,提升噪声鲁棒性。
创新点4:非易失性TCAM集成(系统创新) - 结合90 nm CMOS与蘑菇型相变存储器(PCM)工艺,首次实现1 Mb规模非易失性TCAM芯片,兼具低功耗与高密度特性。
Abstract
This work demonstrates the first fabricated 1 Mb nonvolatile TCAM using 2-transistor/2-resistive-storage (2T-2R) cells to achieve >10× smaller cell size than SRAM-based TCAMs at the same technology node. The test chip was designed and fabricated in IBM 90 nm CMOS technology and mushroom phase-change memory (PCM) tec hnology. The primary challenge for enabling reliable array oper ation with such aggressive cell is p resented, namely, severely de graded sensing margin due to significantly lower ON/OFF ratio of resistive memories (~10² f o rP C M )t h a nt h a to ft r a d i t i o n a lM O S F E T s( > 1 0 5). To address this challenge, two enabling tec hniques were developed and implemented in hardware: 1) two-bit encoding and 2) a clocked self-referenced sensing scheme (CSRSS). In addition, the two-bit encoding can also improve algorithmic mapping by effectively compressing TCAM entries. The 1 Mb chip demonstrates reliable low voltage search operation (VDDmin ~750 mV) and a match delay of 1.9 ns under nominal operating conditions.