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A Deterministic Digital Background Calibration Technique for VCO-Based ADCs
提出一种数字后台校准技术,用于消除VCO型ADC的非线性失真,显著提升信噪比。
90nm CMOS, 5MHz带宽, SNDR从46dB提升至73dB, 功耗4.1mW, 91-112fJ/conv-step
VCO型ADC数字校准非线性校正频率锁定环CMOS
▸采用数字后台校准消除VCO非线性失真
▸引入逆电压-频率传递函数校正信号路径
▸全数字频率锁定环实现校准
Abstract
This paper presents a digital background calibration technique to realize a linear voltage-controlled-oscillator (VCO) based ADC. The distortion caused due to the VCO’s nonlinear tuning characteristics is elimin ated by introducing an inverse voltage-to-frequency transfer function in the signal path. The proposed calibration unit runs in the background and detects the inverse transfer function us ing a highly digital frequency locked loop. Like many other VCO-based ADCs, the proposed technique does not require analog building blocks such as op- erational ampli fiers, multi-bit feed-back DACs etc., and retains the scaling friendly properties. Implemented in a 90 nm CMOS process, the on-chip calibrati on improves SNDR of an open-loop VCO-based ADC from 46 dB to more than 73 dB in 5 MHz signal bandwidth while consuming 4.1 mW power. The ADC achieves a figure-of-merit of 91–112 fJ/conv-step for different input frequencies.