← 返回 JSSC 论文列表JSSC 2014第8期RF & Wireless0.35 µm
A Broadband Sensor Interface IC for Miniaturized Dielectric Spectroscopy From MHz to GHz Mehran Bakhshiani, Student Member , IEEE , Michael A. Suster , Member , IEEE,a n d
一款用于微型化介电光谱测量的宽带传感器接口IC
0.35 µm 2P/4M RF CMOS, 50 MHz至3 GHz
介电光谱传感器接口宽带测量微型化频率响应分析
▸创新点1:宽带频率响应分析方法(bFRA)通过两级下变频技术实现MHz至GHz范围的宽频带信号分析,显著提升了系统的工作频率范围和测量精度(误差<1%),适用于复杂介电材料的频谱分析。
▸创新点2:低噪声放大器(LNA)与有源混频器的协同设计有效降低了系统噪声,提高了信号的信噪比,确保在宽频带范围内(50 MHz至3 GHz)对微弱传感器响应信号的高灵敏度检测。
▸创新点3:可编程增益IF放大级结合相干检测技术,通过灵活的增益调节和I/Q信号处理,实现了对中频信号的精确控制和稳定输出,增强了系统对不同介电材料的适应性。
▸创新点4:采用微型化传感器接口IC与微流控传感器集成,实现了μL级样本量的高频介电谱测量,为便携式生物医学和化学分析设备提供了可行的解决方案。
Abstract
This paper describes a broadband sensor interface IC as part of a miniaturized measurement platform for MHz-t o-GHz dielectric spectroscopy. Developed in 0.35 µm 2P/4M RF CMOS, the IC measures frequ ency-dependent S 21 magnitude and phase of am i c r ofluidic dielectric sensor fabricated in a thick gold-on-glass microfabrication process and loaded with a material-under-test (MUT). The IC architecture implements a broadband frequency response analysis (bFRA) method by first down -converting the sensor response signal from th e RF excitation frequency to an intermediate frequency (IF) o f 1 MHz using a low-noise ampli fier (LNA) and active mixer, followed by down-converting the IF signal to dc using a coherent detector employing IF ampli fication stages with programmable gain, a passi ve mixer driven by in-phase (I) and quadrature-phase (Q) signals anda na c t i v e - R Cl o w - p a s sfilter (LPF). The sensor interfaced wit h the IC is fully capable of differ- entiating among deionized (DI) water, phosphate buffered saline (PBS), ethanol and methanol in tes ts conducted at four different excitation frequencies of 50 MHz, 500 MHz, 1 GHz and 3 GHz. Further, dielectric readings of ethanol from the sensor interfaced with the IC at five excitation frequencies in the range of 50 MHz to 2 GHz are in excellent agreement (error <1%) with those from using a vector network analyzer (VNA) as the sensor readout. A bulk-solution reference measurement by an Agilent 85070E dielec- tric probe kit in