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A 128 Kbit SRAM With an Embedded Energy Monitoring Circuit and Sense-Ampli fier Offset Compensation Using
本文介绍了一种嵌入能量监测电路的128 Kbit SRAM,采用65纳米低功耗CMOS工艺,实现了高能效和高性能操作。
65nm CMOS, 370mV至1.2V供电范围, 能量监测精度10%以内
SRAM能量监测低功耗CMOS传感放大器
▸创新点1:嵌入式能量监测电路(系统创新) - 该论文提出了一种嵌入式能量监测电路,能够精确测量128 Kbit SRAM的绝对能耗,测量精度在10%以内,且仅增加低于1%的主动功耗开销,为系统级能耗优化提供了关键数据支持。
▸创新点2:8T位单元与字线电压提升技术(电路创新) - 采用8T位单元设计并结合字线电压提升技术,使得SRAM能够在370 mV至1.2 V的宽电压范围内稳定工作,显著提升了低电压下的可靠性和能效。
▸创新点3:两级传感方案(电路创新) - 通过引入两级传感方案,结合偏移补偿的感测放大器,并利用体偏置技术,实现了高达2倍的偏移减少,仅增加3.5%的面积开销,显著提升了低电压下的SRAM性能。
▸创新点4:体偏置技术的应用(电路创新) - 在感测放大器中采用体偏置技术,有效降低了偏移电压,进一步提升了感测精度和能效,同时保持了较低的面积开销。
Abstract
Embedded SRAMs are continuing to be one of the most critical components that li mit the performance and energy budget of today’s systems. To enable better system level optimiza- tion, this paper introduces an em bedded energy monitoring cir- cuit that measures the absolute e nergy consumption of a 128 kbit SRAM circuit that is fabricated using a 65 nm low-power CMOS process. Monitoring circuit results are measured to be accurate within 10% of the actual energy consumption and it works with minimal overhead (below 1% active power). Secondly, to achieve energy-efficient and high-performance SRAM operation, various circuit techniques are employed. 8T bit-cells with word-line voltage boosting is used to enable operation for a wide supply range from 370 mV to 1.2 V. Since variation effects are more prominent at low-voltages, SRAM performance is improved by using a two stage sensing scheme. Global sensing is performed by offset compensated sense ampli fiers that leverage body biasing to achieve up to 2× offset reduction for only 3.5% area overhead compared to SRAM area.