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JSSC 2015第2期Data Converters45nmSAR ADCDAC

A Decision-Error-Tolerant 45 nm CMOS 7b 1 GSs Nonbinary 2bCycle SAR ADC Hyeok-Ki

45nm CMOS工艺下7位1GS/s非二进制2b/周期SAR ADC,具有容错能力。
45nm CMOS, 1.25V, 1GS/s, 41.6dB SNDR, 6 ENOB, 80fJ/conversion-step, 7.2mW
SAR ADC非二进制容错高速低功耗
双DAC结构消除采样偏移
非二进制决策方案提升速度和鲁棒性
动态寄存器和直接DAC控制减少逻辑延迟
Abstract
A compact decision-error-tolerant 2b/cycle SAR ADC architecture is presented. Two DACs with different desi g- nated functions, SIG-DAC an d REF-DAC, are implemented to make the structure compact and to eliminate the sampling skew issue. Use of a nonbinary decision scheme with deci sion redundan- cies not only increases the ADC speed with a relaxed DAC settling requirement but also makes the performance robust to reference fluctuations and comparator offset variations. The proposed dynamic registe