← 返回 JSSC 论文列表JSSC 2015第2期Data Converters45nmSAR ADCDAC
A Decision-Error-Tolerant 45 nm CMOS 7b 1 GSs Nonbinary 2bCycle SAR ADC Hyeok-Ki
45nm CMOS工艺下7位1GS/s非二进制2b/周期SAR ADC,具有容错能力。
45nm CMOS, 1.25V, 1GS/s, 41.6dB SNDR, 6 ENOB, 80fJ/conversion-step, 7.2mW
SAR ADC非二进制容错高速低功耗
▸双DAC结构消除采样偏移
▸非二进制决策方案提升速度和鲁棒性
▸动态寄存器和直接DAC控制减少逻辑延迟
Abstract
A compact decision-error-tolerant 2b/cycle SAR
ADC architecture is presented. Two DACs with different desi g-
nated functions, SIG-DAC an d REF-DAC, are implemented to
make the structure compact and to eliminate the sampling skew
issue. Use of a nonbinary decision scheme with deci sion redundan-
cies not only increases the ADC speed with a relaxed DAC settling
requirement but also makes the performance robust to reference
fluctuations and comparator offset variations. The proposed
dynamic registe