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Low Swing-Sample-and-Couple Sense Amplifier and Energy-Efficient Self-Boost-Write-Termination Scheme for Embedded ReRAM Macros Against Resistance and Switch-Time V ariations
提出一种低摆幅采样耦合感应放大器和自增强写入终止方案,以提高ReRAM的读取性能和能效。
28nm CMOS, 0.27V, 404ns
ReRAM感应放大器能效写入终止低摆幅
▸创新点1:低摆幅采样耦合感应放大器(SS C)是一种电压模式感应放大器,通过降低摆幅和采样耦合技术,显著提高了感应裕度,降低了读取延迟,并在宽范围内实现了更快的读取速度,相比传统电压模式感应放大器具有明显优势。
▸创新点2:自增强写入终止(SBWT)方案采用4T结构,通过快速写入终止技术有效切断SET直流电流,减少了99%的能量浪费,同时面积开销低于0.5%,显著提升了ReRAM宏的能效。
▸创新点3:快速写入终止技术通过优化写入终止机制,显著缩短了写入时间,提高了ReRAM的写入效率,特别是在0.27V电压下实现了404ns的快速写入,验证了SBWT方案的有效性。
Abstract
The designs of resistive RAM (ReRAM) macros are limited by 1) a small sensing margin, limited read- , and slow read access time ( ) caused by a high cell-re- sistance and small cell-resista nce-ratio (R-ratio) and 2) poor power integrity and increased energy waste attributable to a large SET dc-current ( ) resulting from the wide dis- tribution of write (SET)-times ( ). This study proposes a swing-sample-and-couple (SS C) voltage-mode sense ampli- fier (VSA) to enable an approximately greater sensing margin for lower and a faster read speed across a wide range, compared with conventional VSAs. A 4T self-boost-write-terminatio n (SBWT) scheme is proposed to cut off the of devices with a rapid .T h eS B W T scheme reduces 99 of the with an area penalty b e l o w0 . 5 % .Af a b r i c a t e d5 1 2r o w2 8n m1M bR e R A Mm a c r o achieved 404 ns when 0.27 V and confirmed the cutoff by the SBWT.