← 返回 JSSC 论文列表JSSC 2019第3期Digital Circuits
Adaptive Artificial Neural Network-Coupled LDPC ECC as Universal Solution for 3-
提出自适应人工神经网络耦合LDPC纠错码，显著提升3D和2D NAND闪存的容错能力。
数据保持时间提升76倍（3D NAND）和45倍（2D NAND）
人工神经网络LDPC纠错码3D NAND闪存2D NAND闪存数据保持时间
▸自适应ANN补偿复杂存储单元错误
▸动态再现错误与耐久性及数据保持时间的关系
▸精确估计BER和LLR以提升LDPC解码效率
Abstract
Adaptive artificial neural network (ANN)-
coupled low-density parity-check (LDPC) error-correcting
code (ECC) (ANN-LDPC ECC) is proposed to increase
acceptable errors for various
NAND flash memories. The
proposed ANN-LDPC ECC can be the universal solutions for
3-D and 2-D, charge-trap and floating-gate
NAND flash memories.
In 3-D NAND flash, lateral charge migration, vertical charge
de-trap, inter floating-gate capacitive coupling noise, and
inter word-line variations cause errors. On the other hand,