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JSSC 2019第11期Power Management45/65nm

A Modular, Direct Time-of-Flight Depth Sensor in 45/65-nm 3-D-Stacked CMOS Technology

介绍了一种模块化直接飞行时间深度传感器,采用3D堆叠CMOS技术,具有高精度和远距离测量能力。
低分辨率模式:300米最大范围,80厘米精度;高分辨率模式:150米最大范围,7厘米精度;28dB干扰抑制
飞行时间深度传感器SPAD3D堆叠CMOSLiDAR
模块化设计,每个模块自主操作
采用3D堆叠CMOS技术,背照式SPAD探测器
脉冲位置调制激光签名,减少干扰
Abstract
This article introduces a modular, direct time-of- flight (TOF) depth sensor. Each module is digitally synthesized and features a 2 × (8 × 8) single-photon avalanche diode (SPAD) pixel array, an edge-sensitive decision tree, a shared time-to- digital converter (TDC), 21-bit per-pixel memory, and in-locus data processing. Each module operates autonomously, by internal data acquisition, management, and storage, being periodically read out by an external access. The prototype was fabricated in a TSMC 3-D-stacked 45/65-nm CMOS technology, featuring backside illumination (BSI) SPAD detectors on the top tier, and readout circuit on the bottom tier. The sensor was characterized by single-point measurements, in two different modes of resolu- tion and range. In low-resolution mode, a maximum of 300-m and 80-cm accuracy was recorded; on the other hand, in high- resolution mode, the maximum range and accuracy were 150 m and 7 cm, respectively. The module was also used in a flexible scanning light detection and ranging (LiDAR) system, where a 256 × 256 depth map, with millimeter precision, was obtained. A laser signature based on pulse-position modulation (PPM) is also proposed, achieving a maximum of 28-dB interference reduction.