A 28-nm Automotive Flash Microcontroller With Virtualization-Assisted Processor Supporting ISO26262 ASIL D Hiroyuki Kondo

Abstract

In the autonomous driving era, automotive archi- tecture has been rapidly progressing toward electronic control unit (ECU) integration and centralization. Advanced vehicle control is becoming increasingly important for safe driving. It requires microcontroller unit (MCU) integration, the highest automotive safety integrity level (ASIL), and network perfor- mance improvement. A 28-nm 600-MHz automotive flash MCU has been developed for next-generation automotive architecture. The MCU for vehicle control integrates three key features: a virtualization-assisted proce ssor (V AP) for functional safety, a built-in self-test in the field (fie ld-BIST) at a sl eep resume (SR) BIST for functional safety, and a serial gigabit media independent interface (SGMII) for the in-vehicle network. The V AP helps the hypervisor to realize real-time virtualization to execute several different virtual machines without interference. The SR-BIST realizes random hardware failures per hour of 10 −8 in various automotive applications. In the SGMII circuit, we used 5-V transistors for high reliability despite their narrow bandwidth. The automotive MCU satisfies the ISO26262 ASIL D system requirements with a low power consumption of 0.52 W. The V AP can realize the severe automotive control hard real time capability.