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JSSC 2020第3期Other0.13µm

A Physical Unclonable Function With Bit Error Rate - 23 --times- 10-8 Based on C

基于接触形成概率的物理不可克隆函数(PUF),具有极低误码率和高可靠性。
0.13-µm CMOS, 49.99% uniqueness, 0.99973 entropy, bit error rate 23×10^-8
物理不可克隆函数接触形成概率随机源环境稳定性NIST测试
利用金属与硅之间互连层的接触形成概率作为随机源
接触状态在环境噪声下保持稳定
采用数字标准单元结构设计,难以定位比特单元位置
Abstract
This article proposes a physical unclonable function (PUF) based on the contact formation probability. The contact here is the interconnect layer between the metal and the silicon in a chip. As the contact is designed smaller than the size given in the design rule, the contact formation becomes stochastic in a certain range of contact hole sizes and can be a random source for the PUF. Consequently, once the contact state is determined to be either open or short, its connectivity does not change