← 返回 JSSC 论文列表JSSC 2021第3期Data ConvertersSAR ADCCMOS Image Sensor
Low Bit-Depth ADCs for Multi-bit Quanta
比较SAR和SS ADC在量子图像传感器中的功耗表现,SAR ADC功耗更低。
1024 × 896 test chip, 1b to 6bits resolution
量子图像传感器低功耗SAR ADCSS ADCADC功耗比较
▸比较五种ADC在量子图像传感器中的功耗
▸实现SAR和SS ADC并测量其功耗
▸SAR ADC在1b到6b分辨率下功耗降低17倍
Abstract
A 1024 × 896 test chip is presented in this article to explore a low-power readout circuit for a multi-bit quanta image sensor (QIS). Five well-known analog-to-digital converter (ADC) approaches [flash, pipeline, successive approximation register (SAR), cyclic, and single-slope (SS)] are studied, and two types of ADCs, namely, SAR ADCs and SS ADCs, are implemented in the sensor. The ADC power dissipations are compared under the condition of constant imaging throughput in counting photoelectrons. In QIS devices, one LSB corresponds to one photoelectron. Measurement results show that the power consumption of SAR ADC is better than that of the SS ADC and decreases by a factor of 17 when the resolution is changed from 1 b to 6 bits. By contrast, the power consumption of the SS ADCs decreases by a factor of 2.5. Thus, SAR ADCs seem more suitable for use in low-power multi-bit QIS.