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JSSC 2021第7期Memory130nmSRAM

A 05-V Hybrid SRAM Physically Unclonable Function Using Hot Carrier Injection Bu

提出一种基于混合模式SRAM的物理不可克隆函数,兼具高稳定性和低功耗。
0.5V, 2.07fJ/b, 0.29% BER
SRAM物理不可克隆函数热载流子注入低功耗稳定性
采用混合模式操作增强SRAM稳定性
兼容热载流子注入烧录稳定技术
通过加速老化测试验证长期可靠性
Abstract
This article introduces an SRAM-based physically unclonable function (PUF) that employs hybrid-mode operations in the enhancement–enhancement (EE) SRAM mode and CMOS SRAM mode to achieve both high native stability and low power. A data latching scheme based on the hybrid structure enables operations under low supply voltage (V DD). Furthermore, the proposed hybrid SRAM PUF is compatible with hot carrier injection (HCI) burn-in stabilization, which can reinforce PUF stability to ∼100% without the