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A 16-Gb/s − 11.6-dBm OMA Sensitivity 0.7-pJ/bit Optical Receiver in 65-nm CMOS Enabled by Duobinary Sampling Mostafa G. Ahmed , Student Member , IEEE, Dongwook Kim , Student Member , IEEE, Romesh
65nm CMOS工艺下实现16Gb/s、-11.6dBm OMA灵敏度的低功耗光接收机
16Gb/s, -11.6dBm OMA灵敏度, 0.7pJ/bit能效
光接收机强度调制直接检测跨阻放大器双二进制采样能效优化
▸采用有限带宽跨阻放大器与双二进制采样结合技术
▸利用受控ISI替代DFE实现高效数据恢复
▸CMOS模拟前端实现高线性度与能效
Abstract
High-speed, low-power optical interconnects, such as intensity modulation direct detection (IMDD) optical links, are increasingly deployed in data centers to keep pace with the growing bandwidth requirements. High-sensitivity low-power optical receivers (RXs) are the key components that enable energy-efficient IMDD optical interconnects. This article presents a low-power nonreturn-to-zero (NRZ) optical RX using a combi- nation of a limited-bandwidth trans-impedance amplifier (TIA) and duobinary sampling to improve RX sensitivity at high data rates. Duobinary sampling leverages the well-controlled TIA inter-symbol interference (ISI) to recover the transmitted data, making it much more hardware efficient than canceling the ISI using a decision feedback equalizer (DFE). The proposed optical RX employs a CMOS-based analog front-end (AFE) to achieve high linearity and excellent power efficiency. Fabricated in 65-nm CMOS process, the prototype RX achieves optical modulation amplitude (OMA) sensitivity of −11.6 dBm at 16 Gb/s with 0.7-pJ/bit efficiency.