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JSSC 2021第12期Other

Fully Integrated GaN-on-Silicon Gate Driver and GaN Switch With Temperature-Comp

提出了一种集成温度补偿控制器的12V GaN驱动器和650V GaN开关,支持50MHz高频操作。
50MHz, 118.3 V/ns
GaN温度补偿高频开关集成驱动快速开启
创新点1:温度补偿控制器(电路创新)。该控制器通过内部温度补偿机制,确保在不同温度下开关的稳定性和高效性,显著提升了系统的可靠性和性能。
创新点2:集成驱动与开关(系统创新)。采用12V耗尽模式GaN和增强模式GaN的单片集成设计,实现了驱动与开关的高度集成,简化了系统结构,提高了整体效率。
创新点3:快速开启技术(方法创新)。通过快速开启技术(FTO)和片上稳压器,实现了高速开关操作,开关频率可达50MHz,dVDS/dt斜率高达118.3V/ns,显著提升了系统的高效性和高速性能。
创新点4:Miller平台电压跟踪(电路创新)。提出的控制器能够准确跟踪Miller平台电压,确保开关过程中的精确控制,进一步提高了系统的稳定性和效率。
Abstract
In this article, a monolithically integrated driver fabricated by 12-V depletion mode gallium nitride (dGaN) and enhanced mode GaN (eGaN) driver is proposed. The proposed driver features an internal temperature-compensated (T-compensated) controller to drive an integrated 650-V eGaN power switch. Due to T-compensated characteristics, a slew-rate enhancement driver can be well-controlled by the fast turn-on (FTO) technique which is supplied by an on-chip regulator with reference voltage circuit.