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JSSC 2022第9期Data Converters40nmFlash ADCDAC

A 7-Bit Two-Step Flash ADC With Sample-and-Hold Sharing Technique Dong-Ryeol Oh ,M i n - J a eS e o

一种采用采样保持共享技术的7位两步式闪存ADC,具有高带宽和低功耗特性。
40nm CMOS, 0.9V, 3GS/s
两步式闪存ADC时间交错带宽扩展功耗优化偏移校准
创新点1:参考嵌入闪存ADC技术(电路创新)。通过仅在精细阶段使用单个电容性DAC,显著提高了功率效率和面积效率,同时扩展了输入带宽,实现了更高的系统性能。
创新点2:采样保持共享结构(系统创新)。该结构消除了精细ADC输入电容的影响,提升了输入带宽,并消除了粗ADC与精细ADC之间的增益误差,优化了整体系统精度。
创新点3:斜率匹配偏移校准技术(方法创新)。在八倍插值的精细ADC中,采用先进的顺序斜率匹配校准技术,提高了电压-时间转换器的增益和插值线性度,显著改善了信号处理的准确性。
创新点4:时间交错技术(系统创新)。通过双通道时间交错设计,实现了3 GS/s的高采样率,并结合时间偏移校准,将有效分辨率带宽从4.8 GHz提升至7 GHz,显著提升了ADC的动态性能。
Abstract
A 7-bit 3 GS/s two-channel time-interleaved two-step flash analog-to-digital converter (ADC) with 7-GHz effective resolution bandwidth (ERBW) is presented. A reference- embedding flash ADC for a fine stage having only a single capaci- tive digital-to-analog converter improves the power efficiency and area efficiency as well as the input bandwidth. The proposed sample-and-hold sharing structure not only improves the input bandwidth by removing the effect of the input capacitance of the fine ADC (FADC) but also eliminates the gain error between the coarse ADC and the FADC. The advanced sequential slope-matching offset calibra tion technique in the eight-time interpolated FADC improves the gain of the voltage-to-time converter and the interpolation linearity. A prototype ADC imple- mented in a 40-nm CMOS process occupies 0.03 mm 2, including offset calibration circuitry. The measured peak differential non- linearity (DNL) and integral non-linearity (INL) after calibration are 0.53 and 0.47 LSB, respectively. With a 1.49-GHz input, the measured signal-to-noise and distortion ratio (SNDR) and spurious-free dynamic range (SFDR) are 39.94 and 55.78 dB, respectively. The ERBW without and with time skew calibration is 4.8 and 7 GHz, respectively. The power consumption is 6.8 mW under a supply voltage of 0.9 V , leading to a figure of merit (FoM) of 28 fJ/conversion-step at 3 GS/s.