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JSSC 2022第9期Other90nm

Radiation Tolerant Multi-Bit Flip-Flop System With Embedded Timing Pre-Error Sen

一种抗辐射多比特触发器系统，具有嵌入式时序预错误检测功能。
ST BCD 90-nm技术实现，基于ARM Cortex M4微处理器验证
抗辐射多比特触发器时序预错误检测动态电压频率调整单粒子效应
▸抗单粒子翻转和单粒子瞬态辐射效应
▸嵌入式时序预错误检测实现闭环优化工作点
▸支持动态电压频率调整和老化/辐射诱导时序退化检测
Abstract
This article presents the design, implementation methodology, and validation of a multi-bit flip-flop (FF) system that provides tolerance against single-event upsets (SEUs) and single-event transients (SETs) caused by radiation strikes. The proposed solution also has embedded timing pre-error sens- ing capability, which enables closed-loop integration of digital systems to work at optimal operating point (OPP) without any fail. It allows efficient real-time dynamic voltage frequency scaling (DVFS)