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A 13b 600-675MS/s Tri-State Pipelined-SAR ADC With Inverter-Based Open-Loop Residue Amplifier
一款采用三态SAR逻辑和开环逆变器残差放大器的13位高速流水线-SAR ADC。
40nm CMOS, 1.1-1.2V, 600-675MS/s, 62.8dB SNDR, 7.05mW
流水线-SAR ADC三态SAR逻辑开环残差放大器比较器亚稳态高速ADC
▸利用比较器亚稳态实现三态SAR逻辑,加快逼近过程
▸提出开环逆变器残差放大器,增益由gm比定义,抗PVT变化
▸亚稳态边界设置为±1/4 LSB时,ENOB可提升1位
Abstract
This article presents a 13-b high-speed pipelined- successive-approximation-register (pipelined-SAR) analog- to-digital converter (ADC). By utilizing the comparator metastability, a tri-state SAR logic is introduced to achieve a fast approximation process. The tri-state SAR outputs three states by one comparator after each comparison cycle, and the effective-number-of-bits (ENOBs) can improve up to 1 b when the metastability boundary is set at ±1/4 LSB. In addition, an open-loop inverter-based residue amplifier (RA) is proposed with simple circuit implementation. The RA gain is well defined by g m ratio and is immune to process, voltage, and temperature (PVT) variations. Fabricated in 40-nm CMOS technology, the prototype ADC achieves a mean signal-to-noise plus distortion ratio (SNDR) of 59.8–62.8 dB, with 1- σ than 1.7 dB, at 600–625 MS/s over −40 ◦ to 125 ◦ temperature range and 1.1–1.2 V power s upply range, a 67 dB dynamic range (DR), and a 62.4 dB SNDR for a Nyquist input while sampling at 625 MS/s. The overall power consumption is 7.05 mW.