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JSSC 2023第4期Other100nm CMOS

A 325 F2 Physical Unclonable Function Based on Contact Failure Probability With

基于接触失效概率的物理不可克隆函数(PUF)通过理论分析确定丢弃范围,实现高稳定性和小面积设计。
0.4999均匀性,比特错误率<0.43 ppm
物理不可克隆函数接触失效概率预选方法稳定性小面积设计
基于理论分析的预选方法确定丢弃范围
低丢弃比(0.0177%)实现高稳定性
最小化PUF比特单元面积(325 F2)
Abstract
Preselection methods in which unstable bitcells are discarded are widely used to enhance the stability of the physical unclonable function (PUF). If the discard range of the preselection is too narrow, all unstable bitcells cannot be discarded, whereas, if the discard range is too wide, the PUF circuit area increases because the number of redundant bitcells should increase. Moreover, the discard range of most previous PUFs is not determined by theoretical analysis but rather by repeated measurem