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A Charge Domain SRAM Compute-in-Memory Macro With C-2C Ladder-Based 8-Bit MAC Unit in 22-nm FinFET Process for
提出一种基于C-2C电容梯度的8位SRAM存内计算宏单元,实现高能效与计算精度平衡。
22FFL工艺, 32.2TOPS/W能效, 4.0TOPS/mm²面积效率, 0.5%计算误差
存内计算SRAM电容梯度模拟计算能效优化
▸采用1:2比例电容梯度的电荷域计算方案
▸局部权重复用技术提升存储密度
▸被动模拟计算机制确保PVT稳定性
Abstract
Compute-in-memory (CiM) is one promising solu- tion to address the memory bottleneck existing in traditional computing architectures. However, the tradeoff between energy efficiency and computing precision plagues most CiM imple- mentations, and the low precision imposes a major limitation on CiM’s ability to support practical computational workloads. In this article, a static random access memory (SRAM)-based analog CiM macro is presented with the Intel 22FFL process. By introducing a 1-to-2 ratioed capacitor ladder (C-2C)-based charge domain computing scheme, the proposed CiM prototype chip demonstrates a maximum of 2k multiply-accumulate (MAC) operations in one clock cycle and achieves 32.2-TOPS/W peak power efficiency with 8-bit precision in both input activation and weight while ensuring accurate on-chip matrix–vector mul- tiplications (MVMs) with a computation error less than 0.5%. A4 . 0 - T O P S / m m 2 peak area efficiency is attained by adopting a local weight multiplexing scheme with a 9T SRAM cell, which improves the memory density and reduces the need to refresh the weight stored in the SRAM array. A variety of analog impairment factors, including parasitics, mismatch, and noise, were analyzed to guarantee a suffici ently high multibit linearity. The proposed passive analog computing mechanism ensures the computation accuracy over process–voltage–temperature (PVT), with the measured MVM error deviation of less than 1% over PVT variations.