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JSSC 2023第5期Data Converters28nm

Beyond Eliminating Timing Margin An Efficient and Reliable Negative Margin Timing

提出负裕度时序错误检测方法,提升神经网络加速器性能并降低功耗。
28-nm CMOS, 238%频率增益或59%功耗降低
时序错误检测负裕度神经网络加速器低功耗近阈值电压
负裕度时序错误检测(NMED)方法提升检测可靠性
低开销低延迟过渡检测器(TD)仅需16个晶体管
基于传输门的短路径填充方法高效扩展短路径
Abstract
Resilient circuits with timing error detection and correction (EDAC) can eliminate the excess timing margin but suffer from miss detection risk due to inactivation of the critical paths. We propose a negative margin timing error detection (NMED) method to increase detection reliability, which further pushes the timing margin to beyond eliminating it, by monitoring less critical yet often activated paths instead of the most critical but rarely activated paths. To further reduce its area overhead,