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JSSC 2023第7期Clocking & PLLs40nm/28nm/7nmSRAMNeural Network Accelerator

Disturbance Aware Dynamic Power Reduction in Synchronous 2RW Dual-Port 8T SRAM b

提出一种动态功耗降低技术,通过自适应字线脉冲控制减少双端口8T SRAM的读写功耗。
40nm/28nm/7nm Fin-FET, 读写功耗分别降低6%-13%和13%-28%, 无速度损失
双端口SRAM8T存储单元动态功耗字线控制Fin-FET工艺
引入自调整字线脉冲时序控制电路
通过行地址比较检测相同行访问以延长字线脉冲宽度
在不同行访问时缩短字线脉冲宽度以减少位线放电功耗
Abstract
An effective design is proposed to reduce dynamic power consumption for a common clock synchronous two-read/ write (2RW) dual-port (DP) 8T static random access memory (SRAM). A self-adjusting wordline (WL) pulse timing control circuit is newly introduced for read/write operations. Row address inputs of ports A and B are compared in each cycle to detect the same row access or not. In the same row access from both ports, the disturbance should happen, which is an inherent mode of 2RW DP 8T SRAM. T