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JSSC 2023第12期Other0.18µm

A Sub-1 V Capacitively Biased BJT-Based Temperature Sensor With an Inaccuracy of

提出一种低于1V的BJT温度传感器,采用电容偏置技术,实现高精度和高效能。
0.18-µm CMOS, 0.95V, 810nW, ±0.15°C inaccuracy, 0.34pJ·K² FoM
BJT温度传感器电容偏置开关电容ADC自归零反相器高效能
创新点1:电容偏置技术减少头空间需求(方法创新)。通过预充电采样电容至电源电压并放电通过BJT,减少了传统电流源所需的额外头空间,仅需约150 mV,显著降低了工作电压需求。
创新点2:采用开关电容ADC实现温度数字化(电路创新)。利用开关电容技术将BJT的基极-发射极电压转换为数字信号,实现了高精度的温度测量,支持低电压操作。
创新点3:自归零反相器积分器提高能效(电路创新)。采用自归零反相器积分器,增强了ADC的鲁棒性和能效,使传感器在0.95 V电源下仅消耗810 nW,显著降低了功耗。
创新点4:高精度与低功耗性能(系统创新)。传感器在-55°C至125°C范围内实现了±0.15°C的精度(3σ),且分辨率FoM为0.34 pJ·K²,比同类高精度BJT传感器低6倍以上。
Abstract
This article presents a sub-1 V bipolar junction transistor (BJT)-based temperature sensor that achieves both high accuracy and high energy efficiency. To avoid the extra headroom required by conventional current sources, the sensor’s diode-connected BJTs are biased by precharging sampling capac- itors to the supply voltage and then discharging them through the BJTs. This capacitive biasing technique requires little headroom (∼150 mV), and simultaneously samples the BJTs’ base–emitter voltages.